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Materials Today News - 15 May 2012

Editor's Choice

NEXAFS imaging of synthetic organic materials - Review article Watts and Ade illustrate the basic operating principles of near edge x-ray absorption fine structure spectroscopy (NEXAFS) spectroscopy, scanning transmission x-ray microscopy, and resonant soft x-ray scattering. More

Nuclear Materials Conference

Biomaterials

First custom designed protein crystal
Structures to help our understanding of protein crystallization... More

Ferroelectric amino acids
Electronics meets biology ... More

Nanoparticles may increase plant DNA damage
Mutagenic nanotechnology... More

Characterization

Super-resolution imaging of live cell structures
Imaging single cellular structures in motion... More

Electronic materials

Self-assembling conductive nanofibers
Miniature plastic components... More

Organic transistors do well in hot water
Could be the key to sterilizable, flexible organic electronics... More

Energy

Liquid solar cells
Nanocrystal liquid inks for energy... More

Graphene boosts efficiency of next-generation solar cells
Graphene sheets as electron bridges... More

Bilayer polymers as efficient photovoltaics
Findings may offer clues to developing superior materials... More

Metals and alloys

Golden potential for thin films
Directed self-assembly for device-ready thin films... More

Nanotechnology

Nanotech safety and ethics
New paper looks at the nano-state-of-play... More

Nano decorations boost electrical and catalytic performance
New technique is simpler, faster and provides greater control... More

Boron-nitride nanotubes show potential for cancer treatment
Doubling the effectiveness of certain treatments... More

Optical materials

Single nanomaterial yields many laser colours
Somewhere under the rainbow... More

Tools and Techniques

Researchers solve 40 year old phasing problem
And double the resolution, sensitivity and mass accuracy of Fourier Transform Mass Spectrometry ... More

New microscope for 3D imaging
A whole new dimension... More

Events

Denver X-ray Conference
Dates: 06 August 2012 until 10 August 2012
Location: Denver, Colarado, USA
Website: http://www.dxcicdd.com/
More

SPIE Optics + Photonics 2012
Dates: 12 August 2012 until 16 August 2012
Location: San Diego, California, USA
Website: http://spie.org/x30491.xml
More

XI International Conference on Nanostructured Materials
Dates: 26 August 2012 until 31 August 2012
Location: Rhodes, Greece
Website: http://www.nano2012.org/
More

2012 MRS Fall Meeting & Exhibit
Dates: 26 November 2012 until 30 November 2012
Location: Boston, Massachusetts, USA
Website: http://www.mrs.org/fall2012/
More

For a full list of events and conferences, please visit
http://www.materialstoday.com/events/

High Temp
Raman
Bruker
Oxford Instruments
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